Zero-shot anomaly detection (ZSAD) recognizes and localizes anomalies in previously unseen objects by establishing feature mapping between textual prompts and inspection images, demonstrating excellent research value in flexible industrial manufacturing. However, existing ZSAD methods are limited by closed-world settings, struggling to unseen defects with predefined prompts. Recently, adapting Multimodal Large Language Models (MLLMs) for Industrial Anomaly Detection (IAD) presents a viable solution. Unlike fixed-prompt methods, MLLMs exhibit a generative paradigm with open-ended text interpretation, enabling more adaptive anomaly analysis. However, this adaption faces inherent challenges as anomalies often manifest in fine-grained regions and exhibit minimal visual discrepancies from normal samples. To address these challenges, we propose a novel framework VMAD (Visual-enhanced MLLM Anomaly Detection) that enhances MLLM with visual-based IAD knowledge and fine-grained perception, simultaneously providing precise detection and comprehensive analysis of anomalies. Specifically, we design a Defect-Sensitive Structure Learning scheme that transfers patch-similarities cues from visual branch to our MLLM for improved anomaly discrimination. Besides, we introduce a novel visual projector, Locality-enhanced Token Compression, which mines multi-level features in local contexts to enhance fine-grained detection. Furthermore, we introduce the Real Industrial Anomaly Detection (RIAD), a comprehensive IAD dataset with detailed anomaly descriptions and analyses, offering a valuable resource for MLLM-based IAD development. Extensive experiments on zero-shot benchmarks, including MVTec-AD, Visa, WFDD, and RIAD datasets, demonstrate our superior performance over state-of-the-art methods. The code and dataset will be available soon.