This work presents a novel and effective method for fitting multidimensional ellipsoids to scattered data in the contamination of noise and outliers. We approach the problem as a Bayesian parameter estimate process and maximize the posterior probability of a certain ellipsoidal solution given the data. We establish a more robust correlation between these points based on the predictive distribution within the Bayesian framework. We incorporate a uniform prior distribution to constrain the search for primitive parameters within an ellipsoidal domain, ensuring ellipsoid-specific results regardless of inputs. We then establish the connection between measurement point and model data via Bayes' rule to enhance the method's robustness against noise. Due to independent of spatial dimensions, the proposed method not only delivers high-quality fittings to challenging elongated ellipsoids but also generalizes well to multidimensional spaces. To address outlier disturbances, often overlooked by previous approaches, we further introduce a uniform distribution on top of the predictive distribution to significantly enhance the algorithm's robustness against outliers. We introduce an ϵ-accelerated technique to expedite the convergence of EM considerably. To the best of our knowledge, this is the first comprehensive method capable of performing multidimensional ellipsoid specific fitting within the Bayesian optimization paradigm under diverse disturbances. We evaluate it across lower and higher dimensional spaces in the presence of heavy noise, outliers, and substantial variations in axis ratios. Also, we apply it to a wide range of practical applications such as microscopy cell counting, 3D reconstruction, geometric shape approximation, and magnetometer calibration tasks.