The performance of machine learning models can significantly degrade under distribution shifts of the data. We propose a new method for classification which can improve robustness to distribution shifts, by combining expert knowledge about the ``high-level" structure of the data with standard classifiers. Specifically, we introduce two-stage classifiers called memory classifiers. First, these identify prototypical data points -- memories -- to cluster the training data. This step is based on features designed with expert guidance; for instance, for image data they can be extracted using digital image processing algorithms. Then, within each cluster, we learn local classifiers based on finer discriminating features, via standard models like deep neural networks. We establish generalization bounds for memory classifiers. We illustrate in experiments that they can improve generalization and robustness to distribution shifts on image datasets. We show improvements which push beyond standard data augmentation techniques.