TEM (Transmission Electron Microscopy) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. This challenge requires the development of new data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook in opportunities of integrating signal processing with automated TEM data analysis.